Characterization of Si particles in additively manufactured AlSi10Mg using synchrotron transmission X-ray nanotomography

M. Defer; S. Dasgupta; A. J. Shahani; X. Xiao; D. Juul Jensen; Y. Zhang

doi:10.1088/1757-899X/1310/1/012027

Characterization of Si particles in additively manufactured AlSi10Mg using synchrotron transmission X-ray nanotomography

M. Defer, S. Dasgupta, A. J. Shahani, X. Xiao, D. Juul Jensen, Y. Zhang

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Abstract

In AlSi10Mg samples manufactured by Laser Powder Bed Fusion, distinguishing the Si eutectic network/Si particles from the Al matrix by X-ray imaging is challenging due to the low absorption contrast between the Al and Si. This work investigates the possibility of overcoming this obstacle in synchrotron transmission X-ray microscopy. Effects of both different defocusing conditions and X-ray beam energies are evaluated and optimal conditions are identified for imaging a sample annealed post-print for 2h at 520°C. It is shown that both large particles (e.g. 4μm) and particles as small as 0.5 μm, can be imaged with reasonable precision in 3D non-destructively.

Original language	English
Article number	012027
Journal	IOP Conference Series: Materials Science and Engineering
Volume	1310
Issue number	1
Number of pages	7
ISSN	1757-8981
DOIs	https://doi.org/10.1088/1757-899X/1310/1/012027
Publication status	Published - 2024

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title = "Characterization of Si particles in additively manufactured AlSi10Mg using synchrotron transmission X-ray nanotomography",

abstract = "In AlSi10Mg samples manufactured by Laser Powder Bed Fusion, distinguishing the Si eutectic network/Si particles from the Al matrix by X-ray imaging is challenging due to the low absorption contrast between the Al and Si. This work investigates the possibility of overcoming this obstacle in synchrotron transmission X-ray microscopy. Effects of both different defocusing conditions and X-ray beam energies are evaluated and optimal conditions are identified for imaging a sample annealed post-print for 2h at 520°C. It is shown that both large particles (e.g. 4μm) and particles as small as 0.5 μm, can be imaged with reasonable precision in 3D non-destructively.",

author = "M. Defer and S. Dasgupta and Shahani, {A. J.} and X. Xiao and {Juul Jensen}, D. and Y. Zhang",

year = "2024",

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T1 - Characterization of Si particles in additively manufactured AlSi10Mg using synchrotron transmission X-ray nanotomography

AU - Defer, M.

AU - Dasgupta, S.

AU - Shahani, A. J.

AU - Xiao, X.

AU - Juul Jensen, D.

AU - Zhang, Y.

PY - 2024

Y1 - 2024

N2 - In AlSi10Mg samples manufactured by Laser Powder Bed Fusion, distinguishing the Si eutectic network/Si particles from the Al matrix by X-ray imaging is challenging due to the low absorption contrast between the Al and Si. This work investigates the possibility of overcoming this obstacle in synchrotron transmission X-ray microscopy. Effects of both different defocusing conditions and X-ray beam energies are evaluated and optimal conditions are identified for imaging a sample annealed post-print for 2h at 520°C. It is shown that both large particles (e.g. 4μm) and particles as small as 0.5 μm, can be imaged with reasonable precision in 3D non-destructively.

AB - In AlSi10Mg samples manufactured by Laser Powder Bed Fusion, distinguishing the Si eutectic network/Si particles from the Al matrix by X-ray imaging is challenging due to the low absorption contrast between the Al and Si. This work investigates the possibility of overcoming this obstacle in synchrotron transmission X-ray microscopy. Effects of both different defocusing conditions and X-ray beam energies are evaluated and optimal conditions are identified for imaging a sample annealed post-print for 2h at 520°C. It is shown that both large particles (e.g. 4μm) and particles as small as 0.5 μm, can be imaged with reasonable precision in 3D non-destructively.

U2 - 10.1088/1757-899X/1310/1/012027

DO - 10.1088/1757-899X/1310/1/012027

M3 - Conference article

SN - 1757-8981

VL - 1310

JO - IOP Conference Series: Materials Science and Engineering

JF - IOP Conference Series: Materials Science and Engineering

IS - 1

M1 - 012027

ER -

Characterization of Si particles in additively manufactured AlSi10Mg using synchrotron transmission X-ray nanotomography

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