Characterization of electrically insulating materials by evironmental scanning electron microscopy

C.C. Appel, A. Horsewell

    Research output: Chapter in Book/Report/Conference proceedingArticle in proceedingsResearch

    Original languageEnglish
    Title of host publicationProceedings. Forty-seventh annual meeting. The Scandinavian Society for Electron Microscopy
    EditorsT. Beisvåg, T.-H. Iversen, J.K. Solberg
    Place of PublicationTrondheim
    PublisherSCANDEM-95
    Publication date1995
    Pages50-51
    Publication statusPublished - 1995
    Event47th Annual Meeting of The Scandinavian Society for Electron Microscopy - Trondheim, Norway
    Duration: 12 Jun 199514 Jun 1995
    Conference number: 47

    Conference

    Conference47th Annual Meeting of The Scandinavian Society for Electron Microscopy
    Number47
    CountryNorway
    CityTrondheim
    Period12/06/199514/06/1995

    Cite this

    Appel, C. C., & Horsewell, A. (1995). Characterization of electrically insulating materials by evironmental scanning electron microscopy. In T. Beisvåg, T-H. Iversen, & J. K. Solberg (Eds.), Proceedings. Forty-seventh annual meeting. The Scandinavian Society for Electron Microscopy (pp. 50-51). SCANDEM-95.