Characterization of dislocation boundary evolution with monochromatic X-ray diffraction

R. Barabash; W. Pantleon

Characterization of dislocation boundary evolution with monochromatic X-ray diffraction

Research output: Chapter in Book/Report/Conference proceeding › Article in proceedings › Research

Original language	English
Title of host publication	Evolution of deformation microstructures in 3D. Proceedings
Editors	C. Gundlach, K. Haldrup, N. Hansen, X. Huang, D. Juul Jensen, T. Leffers, Z.J. Li, S.F. Nielsen, W. Pantleon, J.A. Wert, G. Winther
Place of Publication	Roskilde
Publisher	Risø National Laboratory
Publication date	2004
Pages	233-238
ISBN (Print)	87-550-3362-8
Publication status	Published - 2004
Event	25th Risø International Symposium on Materials Science - Risø, Denmark Duration: 6 Sept 2004 → 10 Sept 2004

Conference

Conference	25th Risø International Symposium on Materials Science
Country/Territory	Denmark
City	Risø
Period	06/09/2004 → 10/09/2004

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Barabash, R., & Pantleon, W. (2004). Characterization of dislocation boundary evolution with monochromatic X-ray diffraction. In C. Gundlach, K. Haldrup, N. Hansen, X. Huang, D. Juul Jensen, T. Leffers, Z. J. Li, S. F. Nielsen, W. Pantleon, J. A. Wert, & G. Winther (Eds.), Evolution of deformation microstructures in 3D. Proceedings (pp. 233-238). Risø National Laboratory.

Barabash, R. ; Pantleon, W. / Characterization of dislocation boundary evolution with monochromatic X-ray diffraction. Evolution of deformation microstructures in 3D. Proceedings. editor / C. Gundlach ; K. Haldrup ; N. Hansen ; X. Huang ; D. Juul Jensen ; T. Leffers ; Z.J. Li ; S.F. Nielsen ; W. Pantleon ; J.A. Wert ; G. Winther. Roskilde : Risø National Laboratory, 2004. pp. 233-238

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Barabash, R & Pantleon, W 2004, Characterization of dislocation boundary evolution with monochromatic X-ray diffraction. in C Gundlach, K Haldrup, N Hansen, X Huang, D Juul Jensen, T Leffers, ZJ Li, SF Nielsen, W Pantleon, JA Wert & G Winther (eds), Evolution of deformation microstructures in 3D. Proceedings. Risø National Laboratory, Roskilde, pp. 233-238, 25th Risø International Symposium on Materials Science, Risø, Denmark, 06/09/2004.

Characterization of dislocation boundary evolution with monochromatic X-ray diffraction. / Barabash, R.; Pantleon, W.
Evolution of deformation microstructures in 3D. Proceedings. ed. / C. Gundlach; K. Haldrup; N. Hansen; X. Huang; D. Juul Jensen; T. Leffers; Z.J. Li; S.F. Nielsen; W. Pantleon; J.A. Wert; G. Winther. Roskilde: Risø National Laboratory, 2004. p. 233-238.

Research output: Chapter in Book/Report/Conference proceeding › Article in proceedings › Research

TY - GEN

T1 - Characterization of dislocation boundary evolution with monochromatic X-ray diffraction

AU - Barabash, R.

AU - Pantleon, W.

PY - 2004

Y1 - 2004

KW - 5-I nano

M3 - Article in proceedings

SN - 87-550-3362-8

SP - 233

EP - 238

BT - Evolution of deformation microstructures in 3D. Proceedings

A2 - Gundlach, C.

A2 - Haldrup, K.

A2 - Hansen, N.

A2 - Huang, X.

A2 - Juul Jensen, D.

A2 - Leffers, T.

A2 - Li, Z.J.

A2 - Nielsen, S.F.

A2 - Pantleon, W.

A2 - Wert, J.A.

A2 - Winther, G.

PB - Risø National Laboratory

CY - Roskilde

T2 - 25th Risø International Symposium on Materials Science

Y2 - 6 September 2004 through 10 September 2004

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