Characterization by Raman scattering, x-ray diffraction, and transmission electron microscopy of (AlAs)m(InAs)m short period superlattices grown by migration enhanced epitaxy

J. Bradshaw; X.J. Song; J.R. Shealy; J. G. Zhu; H. Østergaard

doi:10.1063/1.352139

Characterization by Raman scattering, x-ray diffraction, and transmission electron microscopy of (AlAs)m(InAs)m short period superlattices grown by migration enhanced epitaxy

J. Bradshaw, X.J. Song, J.R. Shealy, J. G. Zhu, H. Østergaard

Technical University of Denmark

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Abstract

We report growth of (InAs)1(AlAs)1 and (InAs)2(AlAs)2 strained layer superlattices by migration enhanced epitaxy. The samples were grown on InP (001) substrates and characterized by Raman spectroscopy, x-ray diffraction, and transmission electron microscopy. Satellite peaks in the x-ray data confirm the intended periodicity and indicate the presence of some disorder in the monolayer sample. The energies of the zone folded and quantum confined optic phonons are in reasonable agreement with calculations based on one-dimensional elastic continuum and linear chain models. Journal of Applied Physics is copyrighted by The American Institute of Physics.

Original language	English
Journal	Journal of Applied Physics
Volume	72
Issue number	1
Pages (from-to)	308-310
ISSN	0021-8979
DOIs	https://doi.org/10.1063/1.352139
Publication status	Published - 1992

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Copyright (1992) American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.

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title = "Characterization by Raman scattering, x-ray diffraction, and transmission electron microscopy of (AlAs)m(InAs)m short period superlattices grown by migration enhanced epitaxy",

abstract = "We report growth of (InAs)1(AlAs)1 and (InAs)2(AlAs)2 strained layer superlattices by migration enhanced epitaxy. The samples were grown on InP (001) substrates and characterized by Raman spectroscopy, x-ray diffraction, and transmission electron microscopy. Satellite peaks in the x-ray data confirm the intended periodicity and indicate the presence of some disorder in the monolayer sample. The energies of the zone folded and quantum confined optic phonons are in reasonable agreement with calculations based on one-dimensional elastic continuum and linear chain models. Journal of Applied Physics is copyrighted by The American Institute of Physics.",

author = "J. Bradshaw and X.J. Song and J.R. Shealy and Zhu, {J. G.} and H. {\O}stergaard",

note = "Copyright (1992) American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.",

year = "1992",

doi = "10.1063/1.352139",

language = "English",

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pages = "308--310",

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Characterization by Raman scattering, x-ray diffraction, and transmission electron microscopy of (AlAs)m(InAs)m short period superlattices grown by migration enhanced epitaxy. / Bradshaw, J.; Song, X.J.; Shealy, J.R. et al.
In: Journal of Applied Physics, Vol. 72, No. 1, 1992, p. 308-310.

Research output: Contribution to journal › Journal article › Research › peer-review

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T1 - Characterization by Raman scattering, x-ray diffraction, and transmission electron microscopy of (AlAs)m(InAs)m short period superlattices grown by migration enhanced epitaxy

AU - Bradshaw, J.

AU - Song, X.J.

AU - Shealy, J.R.

AU - Zhu, J. G.

AU - Østergaard, H.

N1 - Copyright (1992) American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.

PY - 1992

Y1 - 1992

N2 - We report growth of (InAs)1(AlAs)1 and (InAs)2(AlAs)2 strained layer superlattices by migration enhanced epitaxy. The samples were grown on InP (001) substrates and characterized by Raman spectroscopy, x-ray diffraction, and transmission electron microscopy. Satellite peaks in the x-ray data confirm the intended periodicity and indicate the presence of some disorder in the monolayer sample. The energies of the zone folded and quantum confined optic phonons are in reasonable agreement with calculations based on one-dimensional elastic continuum and linear chain models. Journal of Applied Physics is copyrighted by The American Institute of Physics.

AB - We report growth of (InAs)1(AlAs)1 and (InAs)2(AlAs)2 strained layer superlattices by migration enhanced epitaxy. The samples were grown on InP (001) substrates and characterized by Raman spectroscopy, x-ray diffraction, and transmission electron microscopy. Satellite peaks in the x-ray data confirm the intended periodicity and indicate the presence of some disorder in the monolayer sample. The energies of the zone folded and quantum confined optic phonons are in reasonable agreement with calculations based on one-dimensional elastic continuum and linear chain models. Journal of Applied Physics is copyrighted by The American Institute of Physics.

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DO - 10.1063/1.352139

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JO - Journal of Applied Physics

JF - Journal of Applied Physics

IS - 1

ER -

Characterization by Raman scattering, x-ray diffraction, and transmission electron microscopy of (AlAs)m(InAs)m short period superlattices grown by migration enhanced epitaxy

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