Characterisation of fine surfaces using an atomic force microscope mounted on a coordinate measuring machine.

N Kofod, H.N Hansen, Leonardo De Chiffre

Research output: Chapter in Book/Report/Conference proceeding › Article in proceedings › Research › peer-review

Original language	English
Title of host publication	1st Euspen Conference
Publication date	1999
Publication status	Published - 1999
Event	1st International Euspen Conference - Bremen, Germany Duration: 5 Nov 1999 → …

Conference	1st International Euspen Conference
Country/Territory	Germany
City	Bremen
Period	05/11/1999 → …

OpenUrl availability

@inproceedings{a50e9fb8873444e989b079f6727f58cf,

title = "Characterisation of fine surfaces using an atomic force microscope mounted on a coordinate measuring machine.",

author = "N Kofod and H.N Hansen and {De Chiffre}, Leonardo",

year = "1999",

language = "English",

booktitle = "1st Euspen Conference",

note = "1st International Euspen Conference ; Conference date: 05-11-1999",

}