Characterisation of fine surfaces using an atomic force microscope mounted on a coordinate measuring machine.

N Kofod, H.N Hansen, Leonardo De Chiffre

    Research output: Chapter in Book/Report/Conference proceedingArticle in proceedingsResearchpeer-review

    Original languageEnglish
    Title of host publication1st Euspen Conference
    Publication date1999
    Publication statusPublished - 1999
    Event1st International Euspen Conference - Bremen, Germany
    Duration: 5 Nov 1999 → …

    Conference

    Conference1st International Euspen Conference
    CountryGermany
    CityBremen
    Period05/11/1999 → …

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