Change patterns and change support features in process-aware information systems

Barbara Weber, Stefanie Rinderle, Manfred Reichert

Research output: Chapter in Book/Report/Conference proceedingBook chapterResearchpeer-review

Abstract

In order to provide effective support, the introduction of process-aware information systerns (PAIS) must not freeze existing business processes. Instead PAIS should allow authorized users to flexibly deviate from the predefined processes if required and to evolve business processes in a controlled manner over time. Many software vendors promise flexible system solutions for realizing such adaptive PAIS, but are often unable to cope with fundamental issues related to process change (e.g., correctness and robustness). The existence of different process support paradigms and the lack of methods for comparing existing change approaches makes it difficult for PAIS engineers to choose the adequate technology. In this paper we suggest a set of changes patterns and change support features to foster systematic comparison of existing process management technology with respect to change support. Based on these change patterns and features, we provide an evaluation of selected systems.
Original languageEnglish
Title of host publicationAdvanced Information Systems Engineering
Number of pages15
Volume4495
PublisherSpringer-Verlag, Berlin Heidelberg
Publication date2007
Pages574-588
DOIs
Publication statusPublished - 2007
Externally publishedYes
EventThe 19th International Conference on Advanced Information Systems Engineering - Trondheim, Norway
Duration: 11 Jun 200715 Jun 2007
Conference number: 19

Conference

ConferenceThe 19th International Conference on Advanced Information Systems Engineering
Number19
Country/TerritoryNorway
CityTrondheim
Period11/06/200715/06/2007
SeriesLecture Notes in Computer Science
ISSN0302-9743

Fingerprint

Dive into the research topics of 'Change patterns and change support features in process-aware information systems'. Together they form a unique fingerprint.

Cite this