Cellular scanning strategy for selective laser melting: Evolution of optimal grid-based scanning path & parametric approach to thermal homogeneity

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Abstract

Selective laser melting, as a rapid manufacturing technology, is uniquely poised to enforce a paradigm shift in the manufacturing industry by eliminating the gap between job- and batch-production techniques. Products from this process, however, tend to show an increased amount of defects such as distortions, residual stresses and cracks; primarily attributed to the high temperatures and temperature gradients occurring during the process. A unit cell approach towards the building of a standard sample, based on literature, has been investigated in the present work. A pseudo-analytical model has been developed and validated using thermal distributions obtained using different existing scanning strategies. Several existing standard and non-standard scanning methods have been evaluated and compared using the empirical model as well as a 3D-thermal finite element model. Finally, a new grid-based scan strategy has been developed for processing the standard sample, one unit cell at a time, using genetic algorithms, with an objective of reducing thermal asymmetries. © 2013 SPIE.
Original languageEnglish
JournalProceedings of SPIE, the International Society for Optical Engineering
Volume8608
Pages (from-to)86080M
Number of pages13
ISSN1605-7422
DOIs
Publication statusPublished - 2013
EventLaser-based Micro- and Nanopackaging and Assembly VII - San Francisco, CA, United States
Duration: 6 Feb 20137 Feb 2013
Conference number: 7

Conference

ConferenceLaser-based Micro- and Nanopackaging and Assembly VII
Number7
CountryUnited States
CitySan Francisco, CA
Period06/02/201307/02/2013

Keywords

  • Analytical models
  • Cracks
  • Finite element method
  • Genetic algorithms
  • Laser applications
  • Laser beams
  • Scanning
  • Thermoanalysis
  • Three dimensional computer graphics
  • Three dimensional

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