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CBED crystal polarity analysis of compound semiconductor nanostructures

  • E. Spiecker (Invited author)
  • , Erik Johnson (Invited author)
  • , M. Aagesen (Invited author)
  • , C.B. Sørensen (Invited author)
  • , P.E. Lindelof (Invited author)
  • , W. Jäger (Invited author)

    Research output: Chapter in Book/Report/Conference proceedingConference abstract in proceedingsResearch

    Original languageEnglish
    Title of host publicationMicroscopy and Microanalysis
    Volume13, Suppl. 3
    PublisherCambridge University Press
    Publication date2007
    Pages120-121
    Publication statusPublished - 2007
    EventAnnual meeting of the German Society for Electron Microscopy - Saarbrücken, Germany
    Duration: 2 Sept 20077 Sept 2007

    Conference

    ConferenceAnnual meeting of the German Society for Electron Microscopy
    Country/TerritoryGermany
    CitySaarbrücken
    Period02/09/200707/09/2007

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