CBED crystal polarity analysis of compound semiconductor nanostructures

E. Spiecker (Invited author), Erik Johnson (Invited author), M. Aagesen (Invited author), C.B. Sørensen (Invited author), P.E. Lindelof (Invited author), W. Jäger (Invited author)

    Research output: Chapter in Book/Report/Conference proceedingConference abstract in proceedingsResearch

    Original languageEnglish
    Title of host publicationMicroscopy and Microanalysis
    Volume13, Suppl. 3
    PublisherCambridge University Press
    Publication date2007
    Pages120-121
    Publication statusPublished - 2007
    EventAnnual meeting of the German Society for Electron Microscopy - Saarbrücken, Germany
    Duration: 2 Sep 20077 Sep 2007

    Conference

    ConferenceAnnual meeting of the German Society for Electron Microscopy
    Country/TerritoryGermany
    CitySaarbrücken
    Period02/09/200707/09/2007

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