Catastrophic optical mirror damage in diode lasers monitored during single-pulse operation

M. Zegler; J.W. Tomm; D. Reeber; T. Elsaesser; U. Zeimer; Henning Engelbrecht Larsen; Paul Michael Petersen; Peter E. Andersen

doi:10.1063/1.3133339

Catastrophic optical mirror damage in diode lasers monitored during single-pulse operation

M. Zegler
, J.W. Tomm
, D. Reeber
, T. Elsaesser
, U. Zeimer
, Henning Engelbrecht Larsen
, Paul Michael Petersen
, Peter E. Andersen

Research output: Contribution to journal › Journal article › Research › peer-review

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Abstract

Catastrophic optical mirror damage (COMD) is analyzed for 808 nm emitting diode lasers in single-pulse operation in order to separate facet degradation from subsequent degradation processes. During each pulse, nearfield and thermal images are monitored. A temporal resolution better than 7 µs is achieved. The thermal runaway process is unambiguously related to the occurrence of a “thermal flash.” A one-by-one correlation between nearfield, thermal flash, thermal runaway, and structural damage is observed. The single-pulse excitation technique allows for controlling the propagation of the structural damage into the cavity. We propose this technique for the analysis of early stages of COMD.

Original language	English
Article number	191101
Journal	Applied Physics Letters
Volume	94
Issue number	19
ISSN	0003-6951
DOIs	https://doi.org/10.1063/1.3133339
Publication status	Published - 2009

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Copyright (2009) American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.

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10.1063/1.3133339

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title = "Catastrophic optical mirror damage in diode lasers monitored during single-pulse operation",

abstract = "Catastrophic optical mirror damage (COMD) is analyzed for 808 nm emitting diode lasers in single-pulse operation in order to separate facet degradation from subsequent degradation processes. During each pulse, nearfield and thermal images are monitored. A temporal resolution better than 7 µs is achieved. The thermal runaway process is unambiguously related to the occurrence of a “thermal flash.” A one-by-one correlation between nearfield, thermal flash, thermal runaway, and structural damage is observed. The single-pulse excitation technique allows for controlling the propagation of the structural damage into the cavity. We propose this technique for the analysis of early stages of COMD.",

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note = "Copyright (2009) American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.",

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T1 - Catastrophic optical mirror damage in diode lasers monitored during single-pulse operation

AU - Zegler, M.

AU - Tomm, J.W.

AU - Reeber, D.

AU - Elsaesser, T.

AU - Zeimer, U.

AU - Larsen, Henning Engelbrecht

AU - Petersen, Paul Michael

AU - Andersen, Peter E.

N1 - Copyright (2009) American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.

PY - 2009

Y1 - 2009

N2 - Catastrophic optical mirror damage (COMD) is analyzed for 808 nm emitting diode lasers in single-pulse operation in order to separate facet degradation from subsequent degradation processes. During each pulse, nearfield and thermal images are monitored. A temporal resolution better than 7 µs is achieved. The thermal runaway process is unambiguously related to the occurrence of a “thermal flash.” A one-by-one correlation between nearfield, thermal flash, thermal runaway, and structural damage is observed. The single-pulse excitation technique allows for controlling the propagation of the structural damage into the cavity. We propose this technique for the analysis of early stages of COMD.

AB - Catastrophic optical mirror damage (COMD) is analyzed for 808 nm emitting diode lasers in single-pulse operation in order to separate facet degradation from subsequent degradation processes. During each pulse, nearfield and thermal images are monitored. A temporal resolution better than 7 µs is achieved. The thermal runaway process is unambiguously related to the occurrence of a “thermal flash.” A one-by-one correlation between nearfield, thermal flash, thermal runaway, and structural damage is observed. The single-pulse excitation technique allows for controlling the propagation of the structural damage into the cavity. We propose this technique for the analysis of early stages of COMD.

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DO - 10.1063/1.3133339

M3 - Journal article

SN - 0003-6951

VL - 94

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 19

M1 - 191101

ER -

Catastrophic optical mirror damage in diode lasers monitored during single-pulse operation

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