Catastrophic optical mirror damage in diode lasers monitored during single-pulse operation

M. Zegler, J.W. Tomm, D. Reeber, T. Elsaesser, U. Zeimer, Henning Engelbrecht Larsen, Paul Michael Petersen, Peter E. Andersen

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Catastrophic optical mirror damage (COMD) is analyzed for 808 nm emitting diode lasers in single-pulse operation in order to separate facet degradation from subsequent degradation processes. During each pulse, nearfield and thermal images are monitored. A temporal resolution better than 7 µs is achieved. The thermal runaway process is unambiguously related to the occurrence of a “thermal flash.” A one-by-one correlation between nearfield, thermal flash, thermal runaway, and structural damage is observed. The single-pulse excitation technique allows for controlling the propagation of the structural damage into the cavity. We propose this technique for the analysis of early stages of COMD.
Original languageEnglish
JournalApplied Physics Letters
Issue number19
Pages (from-to)191101
Publication statusPublished - 2009

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Copyright (2009) American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.


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