Catastrophic optical mirror damage in diode lasers monitored during single-pulse operation

M. Zegler, J.W. Tomm, D. Reeber, T. Elsaesser, U. Zeimer, Henning Engelbrecht Larsen, Paul Michael Petersen, Peter E. Andersen

    Research output: Contribution to journalJournal articleResearchpeer-review

    1226 Downloads (Pure)

    Abstract

    Catastrophic optical mirror damage (COMD) is analyzed for 808 nm emitting diode lasers in single-pulse operation in order to separate facet degradation from subsequent degradation processes. During each pulse, nearfield and thermal images are monitored. A temporal resolution better than 7 µs is achieved. The thermal runaway process is unambiguously related to the occurrence of a “thermal flash.” A one-by-one correlation between nearfield, thermal flash, thermal runaway, and structural damage is observed. The single-pulse excitation technique allows for controlling the propagation of the structural damage into the cavity. We propose this technique for the analysis of early stages of COMD.
    Original languageEnglish
    JournalApplied Physics Letters
    Volume94
    Issue number19
    Pages (from-to)191101
    ISSN0003-6951
    DOIs
    Publication statusPublished - 2009

    Bibliographical note

    Copyright (2009) American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.

    Fingerprint

    Dive into the research topics of 'Catastrophic optical mirror damage in diode lasers monitored during single-pulse operation'. Together they form a unique fingerprint.

    Cite this