Abstract
Catastrophic optical mirror damage (COMD) is analyzed for 808 nm emitting diode lasers in single-pulse operation in order to separate facet degradation from subsequent degradation processes. During each pulse, nearfield and thermal images are monitored. A temporal resolution better than 7 µs is achieved. The thermal runaway process is unambiguously related to the occurrence of a “thermal flash.” A one-by-one correlation between nearfield, thermal flash, thermal runaway, and structural damage is observed. The single-pulse excitation technique allows for controlling the propagation of the structural damage into the cavity. We propose this technique for the analysis of early stages of COMD.
Original language | English |
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Journal | Applied Physics Letters |
Volume | 94 |
Issue number | 19 |
Pages (from-to) | 191101 |
ISSN | 0003-6951 |
DOIs | |
Publication status | Published - 2009 |