Abstract
Carrier dynamics of epitaxial ZnO thin film was investigated using
a frequency up-conversion tehcnique. At lower carrier densities,
the decay time of free exciton recombination was measured to be 24
ps. Rapid decay times of a few picoseconds were observed at higher
carrier densities, which show a transition of two dynamic
processes. The comparison of calculated gain spectrum and
experimental data gave evidence that the transition is form
exciton-exciton scattering to the recombination of electron hole
plasma.
Original language | English |
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Title of host publication | Proceedings of the 24th International Conference on The Physics of Semiconductors |
Place of Publication | Singapore |
Publisher | World Scientific |
Publication date | 1999 |
Publication status | Published - 1999 |
Event | 24th International Conference on The Physics of Semiconductors - Jerusalem, Israel Duration: 2 Aug 1998 → 7 Aug 1998 Conference number: 24 http://physics.technion.ac.il/~icps24/ |
Conference
Conference | 24th International Conference on The Physics of Semiconductors |
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Number | 24 |
Country/Territory | Israel |
City | Jerusalem |
Period | 02/08/1998 → 07/08/1998 |
Internet address |