Abstract
A modelling platform for active carrier removal based on metal-semiconductor-metal structure is reported on analysis of carrier dynamics. The analysis reveals electric current hot spots exist in geometric singularities and curly trajectory of carriers should be considered when accurately estimating the effective carrier lifetime.
| Original language | English |
|---|---|
| Title of host publication | Proceedings of 2017 IEEE 14th International Conference on Group IV Photonics (GFP) |
| Publisher | IEEE |
| Publication date | 2017 |
| Pages | 73-74 |
| ISBN (Print) | 978-1-5090-6569-1 |
| ISBN (Electronic) | 978-1-5090-6568-4 |
| DOIs | |
| Publication status | Published - 2017 |
| Event | 2017 IEEE 14th International Conference on Group IV Photonics - Grand Hyatt, Berlin, Germany Duration: 23 Aug 2017 → 25 Aug 2017 Conference number: 14 https://www.photonicssociety.org/images/files/conferences/GFP/2017/2017-GFP-final-program.pdf |
Conference
| Conference | 2017 IEEE 14th International Conference on Group IV Photonics |
|---|---|
| Number | 14 |
| Location | Grand Hyatt |
| Country/Territory | Germany |
| City | Berlin |
| Period | 23/08/2017 → 25/08/2017 |
| Internet address |
Keywords
- Silicon photonics
- Active carrier removal
- Metal-semiconductor-metal
- Carrier lifetime