Original language | English |
---|---|
Journal | Journal of Microscopy |
Volume | 170 |
Pages (from-to) | 125-129 |
ISSN | 0022-2720 |
Publication status | Published - 1993 |
Calibration of an electron back-scattering pattern set-up
N.C. Krieger Lassen, Jørgen Bilde-Sørensen
Research output: Contribution to journal › Journal article › Research › peer-review