Calibration of an electron back-scattering pattern set-up

N.C. Krieger Lassen, Jørgen Bilde-Sørensen

    Research output: Contribution to journalJournal articleResearchpeer-review

    Original languageEnglish
    JournalJournal of Microscopy
    Volume170
    Pages (from-to)125-129
    ISSN0022-2720
    Publication statusPublished - 1993

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