Calibration and Industrial Application of Instrument for Surface Mapping based on AFM

Hans Nørgaard Hansen, Niels Kofod, Leonardo De Chiffre, Tarras Wanheim

    Research output: Contribution to journalJournal articleResearchpeer-review

    Abstract

    The paper describes the calibration and application of an integrated system for topographic characterisation of fine surfaces on large workpieces. The system, consisting of an atomic force microscope mounted on a coordinate measuring machine, was especially designed for surface mapping, i.e., measurement and tiling of adjacent areas. A calibration procedure was proposed involving a glass artefact featuring chromium lines with different pitch distances, giving the possibility to identify the exact position of single surface areas. The calibrated system was used to surface map a hip joint prosthesis consisting of a steel sphere with a polished surface having 3 nm roughness.
    Original languageEnglish
    JournalC I R P Annals
    Volume51/1/2002
    Pages (from-to)471-474
    ISSN0007-8506
    Publication statusPublished - 2002

    Fingerprint Dive into the research topics of 'Calibration and Industrial Application of Instrument for Surface Mapping based on AFM'. Together they form a unique fingerprint.

    Cite this