TY - JOUR
T1 - Calibration and Industrial Application of Instrument for Surface Mapping based on AFM
AU - Hansen, Hans Nørgaard
AU - Kofod, Niels
AU - De Chiffre, Leonardo
AU - Wanheim, Tarras
PY - 2002
Y1 - 2002
N2 - The paper describes the calibration and application of an integrated system for topographic
characterisation of fine surfaces on large workpieces. The system, consisting of an atomic force
microscope mounted on a coordinate measuring machine, was especially designed for surface mapping,
i.e., measurement and tiling of adjacent areas. A calibration procedure was proposed involving a glass
artefact featuring chromium lines with different pitch distances, giving the possibility to identify the exact
position of single surface areas. The calibrated system was used to surface map a hip joint prosthesis
consisting of a steel sphere with a polished surface having 3 nm roughness.
AB - The paper describes the calibration and application of an integrated system for topographic
characterisation of fine surfaces on large workpieces. The system, consisting of an atomic force
microscope mounted on a coordinate measuring machine, was especially designed for surface mapping,
i.e., measurement and tiling of adjacent areas. A calibration procedure was proposed involving a glass
artefact featuring chromium lines with different pitch distances, giving the possibility to identify the exact
position of single surface areas. The calibrated system was used to surface map a hip joint prosthesis
consisting of a steel sphere with a polished surface having 3 nm roughness.
M3 - Journal article
SN - 0007-8506
VL - 51/1/2002
SP - 471
EP - 474
JO - C I R P Annals
JF - C I R P Annals
ER -