Bulk lifetime determination in high purity silicon by
                contactless laser technique

A. B. Fedortsov, D. G. Letenko, Y. V. Churkin, L. M. Tsentiper, Jan Vedde

Research output: Contribution to journal › Journal article › Research › peer-review

Original language	English
Journal	Journal of Materials Science: Materials in Electronics
Volume	8
Pages (from-to)	213-216
ISSN	0957-4522
Publication status	Published - 1997

OpenUrl availability

@article{d24f6777e4934b0db8fda27d3522a94f,

title = "Bulk lifetime determination in high purity silicon by contactless laser technique",

author = "Fedortsov, {A. B.} and Letenko, {D. G.} and Churkin, {Y. V.} and Tsentiper, {L. M.} and Jan Vedde",

year = "1997",

language = "English",

volume = "8",

pages = "213--216",

journal = "Journal of Materials Science: Materials in Electronics",

issn = "0957-4522",

publisher = "Springer New York",

}

TY - JOUR

T1 - Bulk lifetime determination in high purity silicon by contactless laser technique

AU - Fedortsov, A. B.

AU - Letenko, D. G.

AU - Churkin, Y. V.

AU - Tsentiper, L. M.

AU - Vedde, Jan

PY - 1997

Y1 - 1997

M3 - Journal article

VL - 8

SP - 213

EP - 216

JO - Journal of Materials Science: Materials in Electronics

JF - Journal of Materials Science: Materials in Electronics

SN - 0957-4522

ER -