Bulk lifetime and surface recombination measurements on high purity silicon by a laser modulation technique

A. B. Fedortsov, D. G. Letenko, V. Churkin, L. M. Tsentiper, Jan Vedde

    Research output: Chapter in Book/Report/Conference proceedingBook chapterResearchpeer-review

    Original languageEnglish
    Title of host publicationProc. 4th Int. Symp. on High Purity Silicon: Proc. of Electrochem. Soc. 96-13
    PublisherThe Electrochemical Society
    Publication date1996
    Pages481-489
    Publication statusPublished - 1996
    Event4th International Symposium on High Purity Silicon - San Antonio, TX, United States
    Duration: 6 Oct 199611 Oct 1996
    Conference number: 4

    Conference

    Conference4th International Symposium on High Purity Silicon
    Number4
    CountryUnited States
    CitySan Antonio, TX
    Period06/10/199611/10/1996

    Cite this

    Fedortsov, A. B., Letenko, D. G., Churkin, V., Tsentiper, L. M., & Vedde, J. (1996). Bulk lifetime and surface recombination measurements on high purity silicon by a laser modulation technique. In Proc. 4th Int. Symp. on High Purity Silicon: Proc. of Electrochem. Soc. 96-13 (pp. 481-489). The Electrochemical Society.