Abstract
In this paper, we demonstrate a compact broadband on-chip radio-frequency (RF) termination based on pure titanium thin-film resistors integrated into coplanar waveguide (CPW) structures. The terminated transmission lines exhibit good impedance matching, with simulated reflection coefficients below −20 dB over 100 GHz bandwidth and experimentally measured reflections below −10 dB up to 65 GHz. Additional measurements evaluate the stability and power-handling be-havior of the Ti resistors. The results show that thin-film titanium can operate as an effective on-chip RF termination in integrated CPW structures, maintaining stable RF performance over repeated measurements. Such terminations are relevant for high-speed photonic platforms where compact integration and reduced packaging complexity are desirable, including dense modulator architectures.
| Original language | English |
|---|---|
| Article number | 15 |
| Journal | Frontiers of Optoelectronics |
| Volume | 19 |
| Issue number | 2 |
| Number of pages | 10 |
| ISSN | 2095-2759 |
| DOIs | |
| Publication status | Published - 2026 |
Keywords
- Broadband impedance matching
- Coplanar wave-guide (CPW)
- DWDM systems
- On-chip radio-frequency (RF) termination
- Traveling-wave electrodes (TWEs)
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