Broad-band hard X-ray reflectors

K.D. Joensen, P. Gorenstein, P. Hoghoj, J. Susini, E. Ziegler, A. Freund, Finn Erland Christensen, J. Wood, G. Gutman

    Research output: Contribution to journalJournal articleResearchpeer-review

    Abstract

    Interest in optics for hard X-ray broad-band application is growing. In this paper, we compare the hard X-ray (20-100 keV) reflectivity obtained with an energy-dispersive reflectometer, of a standard commercial gold thin-film with that of a 600 bilayer W/Si X-ray supermirror. The reflectivity of the multilayer is found to agree extraordinarily well with theory (assuming an interface roughness of 4.5 Angstrom), while the agreement for the gold film is less, The overall performance of the supermirror is superior to that of gold, extending the band of reflection at least a factor of 2.8 beyond that of the gold, Various other design options are discussed, and we conclude that continued interest in the X-ray supermirror for broad-band hard X-ray applications is warranted.
    Original languageEnglish
    JournalNuclear Instruments & Methods in Physics Research Section B-beam Interactions With Materials and Atoms
    Volume132
    Issue number1
    Pages (from-to)221-227
    ISSN0168-583X
    Publication statusPublished - 1997

    Keywords

    • broad-band hard X-ray filters
    • multilayers optical properties
    • X-ray mirrors

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