Abstract
We examine the suitability of spherical aberration (CS)-corrected (CS) and uncorrected (UC) transmission electron microscopes (TEM) for conventional bright-field imaging of radiation-sensitive materials. We have chosen an individual molecule suspended in vacuum as a hypothetical example of a well-defined radiation-sensitive sample. We find that for this particular sample, CS instruments provide about 30% improvement over an UC instrument in terms of signal/noise ratio per unit electron dose at 300kV. The lowest imaging doses can be achieved in CS instruments equipped with high-brightness electron source operated at low incident electron energies. Our calculations suggest that it may be possible to image individual, iodine- or bromine-substituted organic molecules in bright-field mode, at doses lower than the accepted values for radiation damage of aromatic molecules.
Original language | English |
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Journal | Ultramicroscopy |
Volume | 107 |
Issue number | 1 |
Pages (from-to) | 40-49 |
Number of pages | 10 |
ISSN | 0304-3991 |
DOIs | |
Publication status | Published - 2007 |
Externally published | Yes |
Keywords
- Spherical aberration
- Radiation damage
- Bright-field TEM
- High-resolution TEM
- Single molecule imaging
- Low-dose imaging
- Field-emission source