Box-scan: A novel 3DXRD method for studies of recrystallization and grain growth

Allan Lyckegaard, Henning Friis Poulsen, Wolfgang Ludwig, Richard W. Fonda, Erik Mejdal Lauridsen

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Abstract

Within the last decade a number of x-ray diffraction methods have been presented for non-destructive 3D characterization of polycrystalline materials. 3DXRD [1] and Diffraction Contrast Tomography [2,3,4] are examples of such methods providing full spatial and crystallographic information of the individual grains. Both methods rely on specially designed high-resolution near-field detectors for acquire the shape of the illuminated grains, and therefore the spatial resolution is for both methods limited by the resolution of the detector, currently ~2 micrometers. Applying these methods using conventional far-field detectors provides information on centre of mass, crystallographic orientation and stress state of the individual grains [5], at the expense of high spatial resolution. However, far-field detectors have much higher efficiency than near-field detectors, and as such are suitable for dynamic studies requiring high temporal resolution and set-ups involving bulky sample environments (e.g. furnaces, stress-rigs etc.)
Original languageEnglish
JournalMaterials Science Forum
Volume715-716
Pages (from-to)518-520
ISSN0255-5476
DOIs
Publication statusPublished - 2012
Event4th International Conference on Recrystallization and Grain Growth - Sheffield, United Kingdom
Duration: 4 Jul 20109 Jul 2010

Conference

Conference4th International Conference on Recrystallization and Grain Growth
Country/TerritoryUnited Kingdom
CitySheffield
Period04/07/201009/07/2010

Keywords

  • MATERIALS
  • METALLURGY
  • DIFFRACTION CONTRAST TOMOGRAPHY
  • POLYCRYSTALS

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