Abstract
Within the last decade a number of x-ray diffraction methods have been presented for non-destructive 3D characterization of polycrystalline materials. 3DXRD [1] and Diffraction Contrast Tomography [2,3,4] are examples of such methods providing full spatial and crystallographic information of the individual grains. Both methods rely on specially designed high-resolution near-field detectors for acquire the shape of the illuminated grains, and therefore the spatial resolution is for both methods limited by the resolution of the detector, currently ~2 micrometers. Applying these methods using conventional far-field detectors provides information on centre of mass, crystallographic orientation and stress state of the individual grains [5], at the expense of high spatial resolution. However, far-field detectors have much higher efficiency than near-field detectors, and as such are suitable for dynamic studies requiring high temporal resolution and set-ups involving bulky sample environments (e.g. furnaces, stress-rigs etc.)
Original language | English |
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Journal | Materials Science Forum |
Volume | 715-716 |
Pages (from-to) | 518-520 |
ISSN | 0255-5476 |
DOIs | |
Publication status | Published - 2012 |
Event | 4th International Conference on Recrystallization and Grain Growth - Sheffield, United Kingdom Duration: 4 Jul 2010 → 9 Jul 2010 |
Conference
Conference | 4th International Conference on Recrystallization and Grain Growth |
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Country/Territory | United Kingdom |
City | Sheffield |
Period | 04/07/2010 → 09/07/2010 |
Keywords
- MATERIALS
- METALLURGY
- DIFFRACTION CONTRAST TOMOGRAPHY
- POLYCRYSTALS