Boundary migration in a 3D deformed microstructure inside an opaque sample

Yubin Zhang, J D Budai, Jonathan Z. Tischler, W. Liu, Ruichao Xu, E. R. Homer, A Godfrey, Dorte Juul Jensen

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Abstract

How boundaries surrounding recrystallization grains migrate through the 3D network of dislocation boundaries in deformed crystalline materials is unknown and critical for the resulting recrystallized crystalline materials. Using X-ray Laue diffraction microscopy, we show for the first time the migration pattern of a typical recrystallization boundary through a well-characterized deformation matrix. The data provide a unique possibility to investigate effects of both boundary misorientation and plane normal on the migration, information which cannot be accessed with any other techniques. The results show that neither of these two parameters can explain the observed migration behavior. Instead we suggest that the subdivision of the deformed microstructure ahead of the boundary plays the dominant role. The present experimental observations challenge the assumptions of existing recrystallization theories, and set the stage for determination of mobilities of recrystallization boundaries.
Original languageEnglish
Article number4423
JournalScientific Reports
Volume7
Issue number1
Number of pages8
ISSN2045-2322
DOIs
Publication statusPublished - 2017

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