Boundary migration during recrystallization of heavily deformed pure nickel

Yubin Zhang; Dorte Juul Jensen; Andrew Godfrey

doi:10.4028/www.scientific.net/MSF.715-716.329

Boundary migration during recrystallization of heavily deformed pure nickel

Yubin Zhang, Dorte Juul Jensen, Andrew Godfrey

Tsinghua University

Research output: Contribution to journal › Conference article › Research › peer-review

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Abstract

The detailed microstructure in front of recrystallization boundaries and their migration during annealing were traced using ex-situ electron backscatter pattern maps of one and the same surface area taken after annealing. It is observed that many protrusions/detrusions form on the recrystallizing boundaries. During annealing, the recrystallization boundary segments migrate in a stop-go type of fashion, while protrusions and detrusions alternately form and disappear. The
correlation between the protrusions/detrusions and the stop-go type of migration are briefly discussed.

Original language	English
Journal	Materials Science Forum
Volume	715-716
Pages (from-to)	329-332
ISSN	0255-5476
DOIs	https://doi.org/10.4028/www.scientific.net/MSF.715-716.329
Publication status	Published - 2012
Event	4th International Conference on Recrystallization and Grain Growth - Sheffield, United Kingdom Duration: 4 Jul 2010 → 9 Jul 2010

Conference

Conference	4th International Conference on Recrystallization and Grain Growth
Country/Territory	United Kingdom
City	Sheffield
Period	04/07/2010 → 09/07/2010

Keywords

Boundary migration
Protrusions
Electron backscattered pattern (EBSP)
Nickel

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Boundary migration during recrystallization

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@inproceedings{c547cad0b9ee4d8e9a1ffe156610b233,

title = "Boundary migration during recrystallization of heavily deformed pure nickel",

abstract = "The detailed microstructure in front of recrystallization boundaries and their migration during annealing were traced using ex-situ electron backscatter pattern maps of one and the same surface area taken after annealing. It is observed that many protrusions/detrusions form on the recrystallizing boundaries. During annealing, the recrystallization boundary segments migrate in a stop-go type of fashion, while protrusions and detrusions alternately form and disappear. Thecorrelation between the protrusions/detrusions and the stop-go type of migration are briefly discussed.",

keywords = "Boundary migration, Protrusions, Electron backscattered pattern (EBSP), Nickel",

author = "Yubin Zhang and {Juul Jensen}, Dorte and Andrew Godfrey",

year = "2012",

doi = "10.4028/www.scientific.net/MSF.715-716.329",

language = "English",

volume = "715-716",

pages = "329--332",

journal = "Materials Science Forum",

issn = "0255-5476",

publisher = "Scientific.Net",

note = "4th International Conference on Recrystallization and Grain Growth ; Conference date: 04-07-2010 Through 09-07-2010",

}

TY - GEN

T1 - Boundary migration during recrystallization of heavily deformed pure nickel

AU - Zhang, Yubin

AU - Juul Jensen, Dorte

AU - Godfrey, Andrew

PY - 2012

Y1 - 2012

N2 - The detailed microstructure in front of recrystallization boundaries and their migration during annealing were traced using ex-situ electron backscatter pattern maps of one and the same surface area taken after annealing. It is observed that many protrusions/detrusions form on the recrystallizing boundaries. During annealing, the recrystallization boundary segments migrate in a stop-go type of fashion, while protrusions and detrusions alternately form and disappear. Thecorrelation between the protrusions/detrusions and the stop-go type of migration are briefly discussed.

AB - The detailed microstructure in front of recrystallization boundaries and their migration during annealing were traced using ex-situ electron backscatter pattern maps of one and the same surface area taken after annealing. It is observed that many protrusions/detrusions form on the recrystallizing boundaries. During annealing, the recrystallization boundary segments migrate in a stop-go type of fashion, while protrusions and detrusions alternately form and disappear. Thecorrelation between the protrusions/detrusions and the stop-go type of migration are briefly discussed.

KW - Boundary migration

KW - Protrusions

KW - Electron backscattered pattern (EBSP)

KW - Nickel

U2 - 10.4028/www.scientific.net/MSF.715-716.329

DO - 10.4028/www.scientific.net/MSF.715-716.329

M3 - Conference article

SN - 0255-5476

VL - 715-716

SP - 329

EP - 332

JO - Materials Science Forum

JF - Materials Science Forum

T2 - 4th International Conference on Recrystallization and Grain Growth

Y2 - 4 July 2010 through 9 July 2010

ER -

Boundary migration during recrystallization of heavily deformed pure nickel

Abstract

Conference

Keywords

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