Bismuth on copper (110): analysis of the c(2x2) and p(4x1) structures by surface x-ray diffraction

L. Lottermoser, T. Buslaps, R.L. Johnson, R. Feidenhans'l, M. Nielsen, D.-M. Smilgies, E. Landemark, H.L. Meyerheim

    Research output: Contribution to journalJournal article

    Abstract

    Surface X-ray diffraction has been used to analyze the atomic structures of the Cu(110)-c(2 x 2)-Bi and Cu(110)-p(4 x 1)-Bi reconstructions with submonolayer coverages. A quasi-hexagonal c(2 x 2) adlayer structure is formed when half a monolayer of bismuth is deposited; the coverage corresponds to 1.08 x 10(-15) atoms cm(-2). There is one Bi atom per c(2 x 2) surface unit cell, and the nearest-neighbor distance on the planar overlayer was found to be 4.43 Angstrom. In the case of the p(4 x 1) reconstruction formed at a coverage of 0.75 monolayers, both the in-plane and out-of-plane data are in excellent agreement with a model in which every fourth Cu row in the [001] direction of the topmost layer is replaced by Bi atoms to form a substitutional surface alloy. (C) 1997 Elsevier Science B.V.
    Original languageEnglish
    JournalSurface Science
    Volume373
    Issue number1
    Pages (from-to)11-20
    ISSN0039-6028
    DOIs
    Publication statusPublished - 1997

    Fingerprint

    Dive into the research topics of 'Bismuth on copper (110): analysis of the c(2x2) and p(4x1) structures by surface x-ray diffraction'. Together they form a unique fingerprint.

    Cite this