Bias-dependent carrier dynamics studied by laser terahertz emission microscopy with nanometer resolution

Pernille Klarskov Pedersen, Daniel M. Mittleman

Research output: Chapter in Book/Report/Conference proceedingConference abstract in proceedingsResearchpeer-review

Original languageEnglish
Title of host publicationProceedings of 2017 Conference on Lasers and Electro-Optics Europe & European Quantum Electronics Conference (CLEO/Europe-EQEC)
Number of pages1
Volume2017
PublisherOSA Publishing
Publication date2017
Article numberPaper CC_4_5
ISBN (Print)978-1-5090-6736-7
DOIs
Publication statusPublished - 2017
EventThe European Conference on Lasers and Electro-Optics, CLEO_Europe 2017 - Munich (ICM), Germany., Munich, Germany
Duration: 25 Jun 201729 Jun 2017
http://www.cleoeurope.org/

Conference

ConferenceThe European Conference on Lasers and Electro-Optics, CLEO_Europe 2017
LocationMunich (ICM), Germany.
CountryGermany
CityMunich
Period25/06/201729/06/2017
Internet address
SeriesOptics Infobase Conference Papers
ISSN2162-2701

Bibliographical note

From the session: THz Near Field Microscopy and Spectroscopy (CC_4)

Cite this

Pedersen, P. K., & Mittleman, D. M. (2017). Bias-dependent carrier dynamics studied by laser terahertz emission microscopy with nanometer resolution. In Proceedings of 2017 Conference on Lasers and Electro-Optics Europe & European Quantum Electronics Conference (CLEO/Europe-EQEC) (Vol. 2017). [Paper CC_4_5] OSA Publishing. Optics Infobase Conference Papers https://doi.org/10.1109/CLEOE-EQEC.2017.8086436