We demonstrate depletion of terahertz emission from semiconductors by applying a DC bias between a substrate and an AFM probe operating in tapping mode. The depletion is strongly dependent on the probe tapping amplitude.
|Conference||2018 Conference on Lasers and Electro-Optics (CLEO)|
|Location||San Jose Convention Center|
|Period||13/05/2018 → 18/05/2018|
|Series||Optics Infobase Conference Papers|
- Near-field microscopy
- Ultrafast processes in condensed matter, including semiconductors