Bias dependence of laser terahertz emission nanoscopy

Angela Pizzuto, Pernille Klarskov, Daniel M. Mittleman

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Abstract

We demonstrate depletion of terahertz emission from semiconductors by applying a DC bias between a substrate and an AFM probe operating in tapping mode. The depletion is strongly dependent on the probe tapping amplitude.
Original languageEnglish
Title of host publicationCLEO: Applications and Technology 2018
Number of pages2
Volume2018
PublisherIEEE
Publication date2018
ISBN (Electronic)978-1-943580-42-2
DOIs
Publication statusPublished - 2018
Event2018 Conference on Lasers and Electro-Optics (CLEO) - San Jose Convention Center, San Jose, United States
Duration: 13 May 201818 May 2018

Conference

Conference2018 Conference on Lasers and Electro-Optics (CLEO)
LocationSan Jose Convention Center
CountryUnited States
CitySan Jose
Period13/05/201818/05/2018
SeriesOptics Infobase Conference Papers
ISSN2162-2701

Keywords

  • Near-field microscopy
  • Ultrafast processes in condensed matter, including semiconductors

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