@inproceedings{64c77ebfe1a343d39f17af6fcdecbcfe,
title = "Bias dependence of laser terahertz emission nanoscopy",
abstract = "We demonstrate depletion of terahertz emission from semiconductors by applying a DC bias between a substrate and an AFM probe operating in tapping mode. The depletion is strongly dependent on the probe tapping amplitude.",
keywords = "Near-field microscopy, Ultrafast processes in condensed matter, including semiconductors",
author = "Angela Pizzuto and Pernille Klarskov and Mittleman, {Daniel M.}",
year = "2018",
doi = "10.1364/CLEO_AT.2018.JM1A.3",
language = "English",
volume = "2018",
series = "Optics Infobase Conference Papers",
booktitle = "CLEO: Applications and Technology 2018",
publisher = "IEEE",
address = "United States",
note = "2018 Conference on Lasers and Electro-Optics (CLEO) ; Conference date: 13-05-2018 Through 18-05-2018",
}