BER estimation for all-optical regenerators influenced by pattern effects

Svend Bischoff, B. Lading, Jesper Mørk

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Abstract

An efficient method is presented for the estimation of the bit-error rate (BER) of a system employing all-optical regenerators influenced by pattern effects. We theoretically study noise accumulation and noise redistribution in long distance transmission systems employing a delayed interference signal wavelength converter for all-optical regeneration. The BER is studied for return-to-zero signals at bit rates of 2.5 Gb/s (no patterning) up to 40 Gb/s (strong patterning). The calculation of the BER is based on pattern dependent transfer functions, which may be obtained numerically or measured.
Original languageEnglish
JournalI E E E Photonics Technology Letters
Volume14
Issue number1
Pages (from-to)33-35
ISSN1041-1135
DOIs
Publication statusPublished - 2002

Bibliographical note

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