Benefit and challenge of in-situ ETEM experiments: electron beam induced potentials

S. Mildner, D. Mierwaldt, J. Ciston, Takeshi Kasama, Sadegh Yazdi, Marco Beleggia, Jakob Birkedal Wagner, Thomas Willum Hansen, Y. Zhu, C. Jooss

    Research output: Chapter in Book/Report/Conference proceedingConference abstract in proceedingsResearchpeer-review

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    Original languageEnglish
    Title of host publicationProceedings of the Microscopy Conference 2015
    Number of pages2
    Publication date2015
    Pages855-856
    Article numberJS-SFB.09
    Publication statusPublished - 2015
    EventMicroscopy Conference 2015 - Göttingen, Germany
    Duration: 6 Sep 201511 Sep 2015

    Conference

    ConferenceMicroscopy Conference 2015
    CountryGermany
    CityGöttingen
    Period06/09/201511/09/2015

    Cite this

    Mildner, S., Mierwaldt, D., Ciston, J., Kasama, T., Yazdi, S., Beleggia, M., Wagner, J. B., Hansen, T. W., Zhu, Y., & Jooss, C. (2015). Benefit and challenge of in-situ ETEM experiments: electron beam induced potentials. In Proceedings of the Microscopy Conference 2015 (pp. 855-856). [JS-SFB.09]