Band positions used for on-line crystallographic orientation determination from electron back scattering patterns

N.H. Schmidt, Jørgen Bilde-Sørensen, D. Juul Jensen

    Research output: Contribution to journalJournal articleResearchpeer-review

    Original languageEnglish
    JournalScanning Microscopy
    Volume5
    Pages (from-to)637-643
    ISSN0891-7035
    Publication statusPublished - 1991

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