Abstract
We present a comprehensive study of the band bending and alignment at the interface of γ -Al2O3/SrTiO3
heterostructures by hard x-ray photoelectron spectroscopy. Ourmeasurements find no signs for a potential gradient
within the polar γ -Al2O3 film as predicted by the basic electronic reconstruction scenario. We present evidence
for a band bending on the SrTiO3 side of the interface, yielding a roughly 600 meV deep potential trough, which
reaches below the chemical potential and has a spatial expansion of 3–5 unit cells. The band offset between
the bulk valence bands is determined to be also approximately 600 meV, corresponding to aligned bands at the
interface. Finally, the spatial confinement of the interfacial two-dimensional electron system is derived from the
chemically shifted Ti3+ photoemission signal in the Ti 2p core level spectra, measured at various photoelectron
detection angles. It is found to be in excellent agreement with the spatial depth of the potential trough.
| Original language | English |
|---|---|
| Article number | 165118 |
| Journal | Physical Review B Condensed Matter |
| Volume | 91 |
| Issue number | 16 |
| Number of pages | 9 |
| ISSN | 0163-1829 |
| DOIs | |
| Publication status | Published - 2015 |