The demand for X-ray optics increases and so do their performance requirements. Iridium (Ir) thin film coatings have proven to be very robust and exhibit excellent reflective properties within the X-ray regime. However, the residual stress in Ir thin films is high and studies show that thin film Ir coatings with a thickness of 10–30 nm exhibit residual compressive stress1 as illustrated in Figure 1.
|Conference||Space Telescopes and Instrumentation 2020: Ultraviolet to Gamma Ray|
|Period||14/12/2020 → 18/12/2020|