Automatic recognition of deformed and recrystallized regions in partly recrystallized samples using electron back scattering patterns

N.C. Krieger Lassen, D. Juul Jensen, K. Conradsen

    Research output: Chapter in Book/Report/Conference proceedingArticle in proceedingsResearchpeer-review

    Original languageEnglish
    Title of host publicationProceedings of the 10th International Conference on Textures of Materials : PTS 1 and 2 - ICOTOM-10
    PublisherTranstec Publications LTD
    Publication date1994
    Pages149-158
    ISBN (Print)0-87849-681-5
    DOIs
    Publication statusPublished - 1994
    Event10th International Conference on Textures of Materials - Clausthal, Germany
    Duration: 20 Sep 199324 Sep 1993
    Conference number: 10

    Conference

    Conference10th International Conference on Textures of Materials
    Number10
    CountryGermany
    CityClausthal
    Period20/09/199324/09/1993
    SeriesMaterials Science Forum
    Volume157/162
    ISSN0255-5476

    Keywords

    • RECRYSTALLIZATION
    • ELECTRON BACK SCATTERING PATTERNS
    • IMAGE PROCESSING
    • GROWTH RATE
    • FOURIER TRANSFORM
    • CLASSIFICATION
    • AUTOMATION

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