@inproceedings{57f90f38e8db42799299d2bfdc774ed2,
title = "Automatic recognition of deformed and recrystallized regions in partly recrystallized samples using electron back scattering patterns",
keywords = "Materialer til strukturelle form{\aa}l, RECRYSTALLIZATION, ELECTRON BACK SCATTERING PATTERNS, IMAGE PROCESSING, GROWTH RATE, FOURIER TRANSFORM, CLASSIFICATION, AUTOMATION",
author = "{Krieger Lassen}, N.C. and {Juul Jensen}, D. and K. Conradsen",
year = "1994",
doi = "10.4028/www.scientific.net/MSF.157-162.149",
language = "English",
isbn = "0-87849-681-5",
series = "Materials Science Forum",
publisher = "Transtec Publications LTD",
pages = "149--158",
booktitle = "Proceedings of the 10th International Conference on Textures of Materials",
note = "10th International Conference on Textures of Materials, ICOTOM 10 ; Conference date: 20-09-1993 Through 24-09-1993",
}