Automatic high-precision measurements of the location and width of Kikuchi bands in electron backscatter diffraction patterns

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@article{aa9869a8fb5d407ca3b1d9285200f5a8,

title = "Automatic high-precision measurements of the location and width of Kikuchi bands in electron backscatter diffraction patterns",

keywords = "Industrielle materialer",

author = "Lassen, \{Niels Christian Krieger\}",

year = "1998",

language = "English",

volume = "190",

pages = "375--391",

journal = "Journal of Microscopy",

issn = "0022-2720",

publisher = "Wiley-Blackwell",

}