Abstract
Scanning probe microscopy (SPM) techniques rely on computer
recordings of interactions between the tip of a minute probe and
the surface of the small specimen as a function of position; the
measurements are used to depict an image of the atomic-scale
surface topography on the computer screen. Mechanical control,
recording, and data processing must therefore be automated to a
high level of precision and reliability. These general techniques
and the apparatus involved have been described extensively. The
automated methods of such high-resolution microscopy coordinated
with computerized electrochemical measurements as well as
elemental analysis look very promising for elucidating corrosion
reaction mechanisms. The study of initial surface reactions at the
atomic or submicron level is becoming an important field of
research in the understanding of corrosion processes. At present,
mainly two scanning microscope techniques are employed
investigating corrosion processes, and usually in situ: in situ
scanning tunneling microscopy (in situ STM) and in situ scanning
force microscopy (in situ AFM). It is these techniques to which
attention is directed here.
Original language | English |
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Title of host publication | Modern Aspects of Electrochemistry no. 31 |
Place of Publication | New York |
Publisher | Plenum Publishing Corporation |
Publication date | 1997 |
Pages | 269-282 |
Publication status | Published - 1997 |