Automated Detection of Material Defects for High-throughput Electron Micrographs Analysis

Andrei Tudor Durnescu, Sotero Pedro Romero Morón, Christina Nicole König, Joerg R. Jinschek

Research output: Contribution to journalConference abstract in journalResearchpeer-review

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Original languageEnglish
Article number23034
JournalBio Web of Conferences
Volume129
Number of pages2
ISSN2117-4458
DOIs
Publication statusPublished - 2024
EventEuropean Microscopy Congress 2024 - Copenhagen, Denmark
Duration: 25 Aug 202430 Aug 2024

Conference

ConferenceEuropean Microscopy Congress 2024
Country/TerritoryDenmark
CityCopenhagen
Period25/08/202430/08/2024

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