Automated Computer-Based Facility for Measurement of Near-Field Structure of Microwave Radiators and Scatterers

Shantnu R.; Mishra, Tomas J. F.; Pavlasek, Letitia V. Muresan

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Abstract

An automatic facility for measuring the three-dimensional structure of the near fields of microwave radiators and scatterers is described. The amplitude and phase for different polarization components can be recorded in analog and digital form using a microprocessor-based system. The stored data are transferred to a large high-speed computer for bulk processing and for the production of isophot and equiphase contour maps or profiles. The performance of the system is demonstrated through results for a single conical horn, for interacting rectangular horns, for multiple cylindrical scatterers, and for the fields inside an absorber lined chamber.
Original languageEnglish
JournalI E E E Transactions on Instrumentation and Measurement
Volume29
Issue number4
Pages (from-to)455-461
ISSN0018-9456
DOIs
Publication statusPublished - 1980

Bibliographical note

Copyright: 1980 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE

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