Automated Computer-Based Facility for Measurement of Near-Field Structure of Microwave Radiators and Scatterers

Shantnu R.; Mishra; Tomas J. F.; Pavlasek; Letitia V. Muresan

doi:10.1109/TIM.1980.4314979

Automated Computer-Based Facility for Measurement of Near-Field Structure of Microwave Radiators and Scatterers

Shantnu R.; Mishra, Tomas J. F.; Pavlasek, Letitia V. Muresan

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Abstract

An automatic facility for measuring the three-dimensional structure of the near fields of microwave radiators and scatterers is described. The amplitude and phase for different polarization components can be recorded in analog and digital form using a microprocessor-based system. The stored data are transferred to a large high-speed computer for bulk processing and for the production of isophot and equiphase contour maps or profiles. The performance of the system is demonstrated through results for a single conical horn, for interacting rectangular horns, for multiple cylindrical scatterers, and for the fields inside an absorber lined chamber.

Original language	English
Journal	I E E E Transactions on Instrumentation and Measurement
Volume	29
Issue number	4
Pages (from-to)	455-461
ISSN	0018-9456
DOIs	https://doi.org/10.1109/TIM.1980.4314979
Publication status	Published - 1980

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Copyright: 1980 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE

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@article{fecada86427c4d4bb6ca90f711fc57af,

title = "Automated Computer-Based Facility for Measurement of Near-Field Structure of Microwave Radiators and Scatterers",

abstract = "An automatic facility for measuring the three-dimensional structure of the near fields of microwave radiators and scatterers is described. The amplitude and phase for different polarization components can be recorded in analog and digital form using a microprocessor-based system. The stored data are transferred to a large high-speed computer for bulk processing and for the production of isophot and equiphase contour maps or profiles. The performance of the system is demonstrated through results for a single conical horn, for interacting rectangular horns, for multiple cylindrical scatterers, and for the fields inside an absorber lined chamber.",

author = "Mishra, {Shantnu R.;} and Pavlasek, {Tomas J. F.;} and Muresan, {Letitia V.}",

note = "Copyright: 1980 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE",

year = "1980",

doi = "10.1109/TIM.1980.4314979",

language = "English",

volume = "29",

pages = "455--461",

journal = "I E E E Transactions on Instrumentation and Measurement",

issn = "0018-9456",

publisher = "Institute of Electrical and Electronics Engineers",

number = "4",

}

TY - JOUR

T1 - Automated Computer-Based Facility for Measurement of Near-Field Structure of Microwave Radiators and Scatterers

AU - Mishra, Shantnu R.;

AU - Pavlasek, Tomas J. F.;

AU - Muresan, Letitia V.

N1 - Copyright: 1980 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE

PY - 1980

Y1 - 1980

N2 - An automatic facility for measuring the three-dimensional structure of the near fields of microwave radiators and scatterers is described. The amplitude and phase for different polarization components can be recorded in analog and digital form using a microprocessor-based system. The stored data are transferred to a large high-speed computer for bulk processing and for the production of isophot and equiphase contour maps or profiles. The performance of the system is demonstrated through results for a single conical horn, for interacting rectangular horns, for multiple cylindrical scatterers, and for the fields inside an absorber lined chamber.

AB - An automatic facility for measuring the three-dimensional structure of the near fields of microwave radiators and scatterers is described. The amplitude and phase for different polarization components can be recorded in analog and digital form using a microprocessor-based system. The stored data are transferred to a large high-speed computer for bulk processing and for the production of isophot and equiphase contour maps or profiles. The performance of the system is demonstrated through results for a single conical horn, for interacting rectangular horns, for multiple cylindrical scatterers, and for the fields inside an absorber lined chamber.

U2 - 10.1109/TIM.1980.4314979

DO - 10.1109/TIM.1980.4314979

M3 - Journal article

SN - 0018-9456

VL - 29

SP - 455

EP - 461

JO - I E E E Transactions on Instrumentation and Measurement

JF - I E E E Transactions on Instrumentation and Measurement

IS - 4

ER -

Automated Computer-Based Facility for Measurement of Near-Field Structure of Microwave Radiators and Scatterers

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