Atomically engineered interfaces yield extraordinary electrostriction

Haiwu Zhang*, Nini Pryds*, Dae-Sung Park, Nicolas Gauquelin, Simone Santucci, Dennis V. Christensen, Daen Jannis, Dmitry Chezganov, Diana A. Rata, Andrea R. Insinga, Ivano E. Castelli, Johan Verbeeck, Igor Lubomirsky, Paul Muralt, Dragan Damjanovic, Vincenzo Esposito*

*Corresponding author for this work

Research output: Contribution to journalJournal articleResearchpeer-review

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Abstract

Electrostriction is a property of dielectric materials whereby an applied electric field induces a mechanical deformation proportional to the square of that field. The magnitude of the effect is usually minuscule (<10–19 m2 V–2 for simple oxides). However, symmetry-breaking phenomena at the interfaces can offer an efficient strategy for the design of new properties. Here we report an engineered electrostrictive effect via the epitaxial deposition of alternating layers of Gd2O3-doped CeO2 and Er2O3-stabilized δ-Bi2O3 with atomically controlled interfaces on NdGaO3 substrates. The value of the electrostriction coefficient achieved is 2.38 × 10–14 m2 V–2, exceeding the best known relaxor ferroelectrics by three orders of magnitude. Our theoretical calculations indicate that this greatly enhanced electrostriction arises from coherent strain imparted by interfacial lattice discontinuity. These artificial heterostructures open a new avenue for the design and manipulation of electrostrictive materials and devices for nano/micro actuation and cutting-edge sensors.
Original languageEnglish
JournalNature
Volume609
Issue number7928
Pages (from-to)695-700
Number of pages6
ISSN0028-0836
DOIs
Publication statusPublished - 2022

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