Atomic force microscopy measurements of topography and friction in dotriacontane films adsorbed on a $\rm SiO_2$ surface

S. Trogisch, M.J. Simpson, H. Taub, U. G. Volkmann, M. Pino, Flemming Yssing Hansen

Research output: Contribution to journalJournal articleResearchpeer-review

Original languageEnglish
JournalVirtual Journal of Nanoscale Science & Technology
Issue numberOctober 31 2005 issue
Pages (from-to)00
ISSN1553-9644
Publication statusPublished - 2005

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