Atomic Force Microscopy Measurements of Topography and Friction in Dotriacontane Films Adsorbed on $\rm SiO_2$

M. Simpson, S. Trogisch, H. Taub, U.G. Volkmann, M. Pino, S.N. Ehrlich, Flemming Yssing Hansen

Research output: Chapter in Book/Report/Conference proceedingConference abstract in proceedingsResearch

Original languageEnglish
Title of host publicationProceedings of the American Physical Society
Volume50, no 1.
Publication date2005
Publication statusPublished - 2005
EventAmerican Physical Society Meeting 2005 - Los Angeles, CA, United States
Duration: 21 Mar 200525 Mar 2005


ConferenceAmerican Physical Society Meeting 2005
CountryUnited States
CityLos Angeles, CA
Internet address

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