Atomic Force Microscopy Measurements of Topography and Friction in Dotriacontane Films Adsorbed on $\rm SiO_2$

M. Simpson, S. Trogisch, H. Taub, U.G. Volkmann, M. Pino, S.N. Ehrlich, Flemming Yssing Hansen

Research output: Chapter in Book/Report/Conference proceeding › Conference abstract in proceedings › Research

Original language	English
Title of host publication	Proceedings of the American Physical Society
Volume	50, no 1.
Publication date	2005
Pages	142-142
Publication status	Published - 2005
Event	American Physical Society Meeting 2005 - Los Angeles, CA, United States Duration: 21 Mar 2005 → 25 Mar 2005 http://meetings.aps.org/Meeting/MAR05/Content/52

Conference	American Physical Society Meeting 2005
Country/Territory	United States
City	Los Angeles, CA
Period	21/03/2005 → 25/03/2005
Internet address	http://meetings.aps.org/Meeting/MAR05/Content/52

OpenUrl availability

@inbook{795baa9a65f54a2eb728f3f96feb15c0,

title = "Atomic Force Microscopy Measurements of Topography and Friction in Dotriacontane Films Adsorbed on $\rm SiO_2$",

author = "M. Simpson and S. Trogisch and H. Taub and U.G. Volkmann and M. Pino and S.N. Ehrlich and Hansen, {Flemming Yssing}",

year = "2005",

language = "English",

volume = "50, no 1.",

pages = "142--142",

booktitle = "Proceedings of the American Physical Society",

note = "American Physical Society Meeting 2005 ; Conference date: 21-03-2005 Through 25-03-2005",

url = "http://meetings.aps.org/Meeting/MAR05/Content/52",

}

TY - ABST

T1 - Atomic Force Microscopy Measurements of Topography and Friction in Dotriacontane Films Adsorbed on $\rm SiO_2$

AU - Simpson, M.

AU - Trogisch, S.

AU - Taub, H.

AU - Volkmann, U.G.

AU - Pino, M.

AU - Ehrlich, S.N.

AU - Hansen, Flemming Yssing

PY - 2005

Y1 - 2005

M3 - Conference abstract in proceedings

VL - 50, no 1.

SP - 142

EP - 142

BT - Proceedings of the American Physical Society

T2 - American Physical Society Meeting 2005

Y2 - 21 March 2005 through 25 March 2005

ER -