Atomic force microscopy measurement of topography and friction in dotriacontane films adsorbed on SiO_2

Research output: Chapter in Book/Report/Conference proceeding › Conference abstract in proceedings › Research

Original language	English
Title of host publication	Bulletin of the American Physical Society
Volume	49
Publication date	2004
Pages	1346-1346
Publication status	Published - 2004

OpenUrl availability

@inbook{7e768b4c4aba4f4e807d32dccb1f989a,

title = "Atomic force microscopy measurement of topography and friction in dotriacontane films adsorbed on SiO\_2",

author = "S. Trogisch and H. Mo and M. Simpson and H. Taub and U.G. Volkmann and M. Pino and S.N. Ehrlich and Hansen, \{Flemming Yssing\}",

year = "2004",

language = "English",

volume = "49",

pages = "1346--1346",

booktitle = "Bulletin of the American Physical Society",

}

TY - ABST

T1 - Atomic force microscopy measurement of topography and friction in dotriacontane films adsorbed on SiO_2

AU - Trogisch, S.

AU - Mo, H.

AU - Simpson, M.

AU - Taub, H.

AU - Volkmann, U.G.

AU - Pino, M.

AU - Ehrlich, S.N.

AU - Hansen, Flemming Yssing

PY - 2004

Y1 - 2004

M3 - Conference abstract in proceedings

VL - 49

SP - 1346

EP - 1346

BT - Bulletin of the American Physical Society

ER -