Atomic force microscopy measurement of topography and friction in dotriacontane films adsorbed on SiO_2

S. Trogisch, H. Mo, M. Simpson, H. Taub, U.G. Volkmann, M. Pino, S.N. Ehrlich, Flemming Yssing Hansen

Research output: Chapter in Book/Report/Conference proceedingConference abstract in proceedingsResearch

Original languageEnglish
Title of host publicationBulletin of the American Physical Society
Volume49
Publication date2004
Pages1346-1346
Publication statusPublished - 2004

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