The potentials of orientation mapping techniques (in the following referred to as OIM) for studies of thermomechanical processes are analysed. Both transmission electron microscopy (TEM) and scanning electron microscopy (SEM) based OIM techniques are considered. Among the thermomechanical processes, focus is on cold deformation and recrystallization processes. It is described how the OIM techniques may be applied for studies of such processes. Results of OIM measurements supplement more traditional TEM and SEM microstructure characterizations as well as bulk texture measurements, and new information is achieved when the results of OIM and these various techniques are combined. Examples hereof are given to illustrate the potentials of OIM techniques. Finally, limitations of TEM and SEM based OIM for specific applications are discussed.
|Publication status||Published - 1997|