Applications of OIM in SEM and TEM

D. Juul Jensen

Applications of OIM in SEM and TEM

Research output: Contribution to conference › Conference abstract for conference › Research

Original language	English
Publication date	1996
Publication status	Published - 1996
Event	6th Conference on Frontiers of Electron Microscopy in Materials Science: A Decade on the Frontiers - Oak Brook, United States Duration: 4 Jun 1996 → 7 Jun 1996

Conference

Conference	6th Conference on Frontiers of Electron Microscopy in Materials Science
Country/Territory	United States
City	Oak Brook
Period	04/06/1996 → 07/06/1996

OpenUrl availability

Full text

Cite this

@conference{a0c832efc36f48ffa2021cf29e75ea4c,

title = "Applications of OIM in SEM and TEM",

keywords = "Industrielle materialer",

author = "{Juul Jensen}, D.",

year = "1996",

language = "English",

note = "6th Conference on Frontiers of Electron Microscopy in Materials Science : A Decade on the Frontiers ; Conference date: 04-06-1996 Through 07-06-1996",

}