Application of the environmental scanning electron microscope in materials science

C.C. Appel, Jørgen Bilde-Sørensen, A. Horsewell

Research output: Chapter in Book/Report/Conference proceeding › Article in proceedings › Research

Original language	English
Title of host publication	Proceedings of 13th national electron microscopy congress
Editors	E. Tekin, Y. Canberk
Place of Publication	Ankara
Publisher	Turkish Electron Microscopy Society
Publication date	1997
Pages	564-574
Publication status	Published - 1997
Event	13th National Electron Microscopy Congress - Ankara, Turkey Duration: 1 Sept 1997 → 4 Sept 1997 Conference number: 13

Conference	13th National Electron Microscopy Congress
Number	13
Country/Territory	Turkey
City	Ankara
Period	01/09/1997 → 04/09/1997

OpenUrl availability

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title = "Application of the environmental scanning electron microscope in materials science",

keywords = "Industrielle materialer",

author = "C.C. Appel and J{\o}rgen Bilde-S{\o}rensen and A. Horsewell",

year = "1997",

language = "English",

pages = "564--574",

editor = "E. Tekin and Y. Canberk",

booktitle = "Proceedings of 13th national electron microscopy congress",

publisher = "Turkish Electron Microscopy Society",

note = "13th National Electron Microscopy Congress ; Conference date: 01-09-1997 Through 04-09-1997",

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Application of the environmental scanning electron microscope in materials science. / Appel, C.C.; Bilde-Sørensen, Jørgen; Horsewell, A.
Proceedings of 13th national electron microscopy congress. ed. / E. Tekin; Y. Canberk. Ankara: Turkish Electron Microscopy Society, 1997. p. 564-574.

Research output: Chapter in Book/Report/Conference proceeding › Article in proceedings › Research

TY - GEN

T1 - Application of the environmental scanning electron microscope in materials science

AU - Appel, C.C.

AU - Bilde-Sørensen, Jørgen

AU - Horsewell, A.

N1 - Conference code: 13

PY - 1997

Y1 - 1997

KW - Industrielle materialer

M3 - Article in proceedings

SP - 564

EP - 574

BT - Proceedings of 13th national electron microscopy congress

A2 - Tekin, E.

A2 - Canberk, Y.

PB - Turkish Electron Microscopy Society

CY - Ankara

T2 - 13th National Electron Microscopy Congress

Y2 - 1 September 1997 through 4 September 1997

ER -