Application of the environmental scanning electron microscope in materials science

C.C. Appel, Jørgen Bilde-Sørensen, A. Horsewell

    Research output: Chapter in Book/Report/Conference proceedingArticle in proceedingsResearch

    Original languageEnglish
    Title of host publicationProceedings of 13th national electron microscopy congress
    EditorsE. Tekin, Y. Canberk
    Place of PublicationAnkara
    PublisherTurkish Electron Microscopy Society
    Publication date1997
    Pages564-574
    Publication statusPublished - 1997
    Event13. National electron microscopy congress - Ankara (TR), 1-4 Sep
    Duration: 1 Jan 1997 → …

    Conference

    Conference13. National electron microscopy congress
    CityAnkara (TR), 1-4 Sep
    Period01/01/1997 → …

    Cite this

    Appel, C. C., Bilde-Sørensen, J., & Horsewell, A. (1997). Application of the environmental scanning electron microscope in materials science. In E. Tekin, & Y. Canberk (Eds.), Proceedings of 13th national electron microscopy congress (pp. 564-574). Turkish Electron Microscopy Society.