Application of nanometrology to polymer production

Jørgen Garnaes, Simone Tanzi, Matteo Calaon, Jiri Cech, Rafael J. Taboryski, Hans Nørgaard Hansen, Jesper Nørregaard, Morten Hannibal Madsen, Poul-Erik Hansen, Mads Rostgaard Sonne, Henrik Pranov, Guggi Kofod, Yee Cheong Lam, Jesper Henri Hattel, Marco Matteucci, Thomas Lehrmann Christiansen, Søren Friis, Mette Thylstrup Christensen, Wei Li, Sandra Wilson & 2 others Jonatan Kutchinsky, Guido Tosello

Research output: Contribution to conferenceConference abstract for conferenceResearchpeer-review

Original languageEnglish
Publication date2013
Number of pages1
Publication statusPublished - 2013
Event16th International Congress of Metrology - Parisf, France
Duration: 7 Oct 201310 Oct 2013
Conference number: 16

Conference

Conference16th International Congress of Metrology
Number16
CountryFrance
CityParisf
Period07/10/201310/10/2013

Cite this

Garnaes, J., Tanzi, S., Calaon, M., Cech, J., Taboryski, R. J., Hansen, H. N., ... Tosello, G. (2013). Application of nanometrology to polymer production. Abstract from 16th International Congress of Metrology, Parisf, France.
Garnaes, Jørgen ; Tanzi, Simone ; Calaon, Matteo ; Cech, Jiri ; Taboryski, Rafael J. ; Hansen, Hans Nørgaard ; Nørregaard, Jesper ; Madsen, Morten Hannibal ; Hansen, Poul-Erik ; Sonne, Mads Rostgaard ; Pranov, Henrik ; Kofod, Guggi ; Lam, Yee Cheong ; Hattel, Jesper Henri ; Matteucci, Marco ; Christiansen, Thomas Lehrmann ; Friis, Søren ; Thylstrup Christensen, Mette ; Li, Wei ; Wilson, Sandra ; Kutchinsky, Jonatan ; Tosello, Guido. / Application of nanometrology to polymer production. Abstract from 16th International Congress of Metrology, Parisf, France.1 p.
@conference{0c2d3893ad4443bebe31de6e3d7717a3,
title = "Application of nanometrology to polymer production",
author = "J{\o}rgen Garnaes and Simone Tanzi and Matteo Calaon and Jiri Cech and Taboryski, {Rafael J.} and Hansen, {Hans N{\o}rgaard} and Jesper N{\o}rregaard and Madsen, {Morten Hannibal} and Poul-Erik Hansen and Sonne, {Mads Rostgaard} and Henrik Pranov and Guggi Kofod and Lam, {Yee Cheong} and Hattel, {Jesper Henri} and Marco Matteucci and Christiansen, {Thomas Lehrmann} and S{\o}ren Friis and {Thylstrup Christensen}, Mette and Wei Li and Sandra Wilson and Jonatan Kutchinsky and Guido Tosello",
year = "2013",
language = "English",
note = "16th International Congress of Metrology ; Conference date: 07-10-2013 Through 10-10-2013",

}

Garnaes, J, Tanzi, S, Calaon, M, Cech, J, Taboryski, RJ, Hansen, HN, Nørregaard, J, Madsen, MH, Hansen, P-E, Sonne, MR, Pranov, H, Kofod, G, Lam, YC, Hattel, JH, Matteucci, M, Christiansen, TL, Friis, S, Thylstrup Christensen, M, Li, W, Wilson, S, Kutchinsky, J & Tosello, G 2013, 'Application of nanometrology to polymer production' 16th International Congress of Metrology, Parisf, France, 07/10/2013 - 10/10/2013, .

Application of nanometrology to polymer production. / Garnaes, Jørgen; Tanzi, Simone; Calaon, Matteo; Cech, Jiri; Taboryski, Rafael J.; Hansen, Hans Nørgaard; Nørregaard, Jesper ; Madsen, Morten Hannibal ; Hansen, Poul-Erik ; Sonne, Mads Rostgaard; Pranov, Henrik ; Kofod, Guggi; Lam, Yee Cheong ; Hattel, Jesper Henri; Matteucci, Marco; Christiansen, Thomas Lehrmann; Friis, Søren; Thylstrup Christensen, Mette ; Li, Wei ; Wilson, Sandra ; Kutchinsky, Jonatan ; Tosello, Guido.

2013. Abstract from 16th International Congress of Metrology, Parisf, France.

Research output: Contribution to conferenceConference abstract for conferenceResearchpeer-review

TY - ABST

T1 - Application of nanometrology to polymer production

AU - Garnaes, Jørgen

AU - Tanzi, Simone

AU - Calaon, Matteo

AU - Cech, Jiri

AU - Taboryski, Rafael J.

AU - Hansen, Hans Nørgaard

AU - Nørregaard, Jesper

AU - Madsen, Morten Hannibal

AU - Hansen, Poul-Erik

AU - Sonne, Mads Rostgaard

AU - Pranov, Henrik

AU - Kofod, Guggi

AU - Lam, Yee Cheong

AU - Hattel, Jesper Henri

AU - Matteucci, Marco

AU - Christiansen, Thomas Lehrmann

AU - Friis, Søren

AU - Thylstrup Christensen, Mette

AU - Li, Wei

AU - Wilson, Sandra

AU - Kutchinsky, Jonatan

AU - Tosello, Guido

PY - 2013

Y1 - 2013

M3 - Conference abstract for conference

ER -

Garnaes J, Tanzi S, Calaon M, Cech J, Taboryski RJ, Hansen HN et al. Application of nanometrology to polymer production. 2013. Abstract from 16th International Congress of Metrology, Parisf, France.