Applicability of X-ray reflectometry to studies of polymer solar cell degradation

Jens Wenzel Andreasen; Suren Gevorgyan; C.M. Schleputz; Frederik C Krebs

doi:10.1016/j.solmat.2008.02.011

Applicability of X-ray reflectometry to studies of polymer solar cell degradation

Jens Wenzel Andreasen, Suren Gevorgyan, C.M. Schleputz, Frederik C Krebs

Research output: Contribution to journal › Journal article › Research › peer-review

Abstract

Although degradation of polymer solar cells is widely acknowledged, the cause, physical or chemical, has not been identified. The purpose of this work is to determine the applicability of X-ray reflectometry for in situ observation of physical degradation mechanisms. We find that the rough interfaces of the polymer solar cell constituent layers seriously obstruct the sensitivity of the technique, rendering it impossible to elucidate changes in the layer/interface structure at the sub-nanometer level. (c) 2008 Elsevier B.V. All rights reserved.

Original language	English
Journal	Solar Energy Materials & Solar Cells
Volume	92
Issue number	7
Pages (from-to)	793-798
ISSN	0927-0248
DOIs	https://doi.org/10.1016/j.solmat.2008.02.011
Publication status	Published - 2008

Bibliographical note

This work was
further supported by the Danish Strategic Research
Council (DSF 2104-05-0052 and DSF-2104-07-0022).

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10.1016/j.solmat.2008.02.011

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Polymer Solar Cells for Solar Energy Conversion
Krebs, F. C.
01/01/2008 → 31/12/2013
Project: Research

Cite this

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abstract = "Although degradation of polymer solar cells is widely acknowledged, the cause, physical or chemical, has not been identified. The purpose of this work is to determine the applicability of X-ray reflectometry for in situ observation of physical degradation mechanisms. We find that the rough interfaces of the polymer solar cell constituent layers seriously obstruct the sensitivity of the technique, rendering it impossible to elucidate changes in the layer/interface structure at the sub-nanometer level. (c) 2008 Elsevier B.V. All rights reserved.",

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AU - Krebs, Frederik C

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N2 - Although degradation of polymer solar cells is widely acknowledged, the cause, physical or chemical, has not been identified. The purpose of this work is to determine the applicability of X-ray reflectometry for in situ observation of physical degradation mechanisms. We find that the rough interfaces of the polymer solar cell constituent layers seriously obstruct the sensitivity of the technique, rendering it impossible to elucidate changes in the layer/interface structure at the sub-nanometer level. (c) 2008 Elsevier B.V. All rights reserved.

AB - Although degradation of polymer solar cells is widely acknowledged, the cause, physical or chemical, has not been identified. The purpose of this work is to determine the applicability of X-ray reflectometry for in situ observation of physical degradation mechanisms. We find that the rough interfaces of the polymer solar cell constituent layers seriously obstruct the sensitivity of the technique, rendering it impossible to elucidate changes in the layer/interface structure at the sub-nanometer level. (c) 2008 Elsevier B.V. All rights reserved.

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JO - Solar Energy Materials & Solar Cells

JF - Solar Energy Materials & Solar Cells

SN - 0927-0248

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ER -

Applicability of X-ray reflectometry to studies of polymer solar cell degradation

Abstract

Bibliographical note

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Polymer Solar Cells for Solar Energy Conversion

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