Applicability of X-ray reflectometry to studies of polymer solar cell degradation

Jens Wenzel Andreasen, Suren Gevorgyan, C.M. Schleputz, Frederik C Krebs

    Research output: Contribution to journalJournal articleResearchpeer-review


    Although degradation of polymer solar cells is widely acknowledged, the cause, physical or chemical, has not been identified. The purpose of this work is to determine the applicability of X-ray reflectometry for in situ observation of physical degradation mechanisms. We find that the rough interfaces of the polymer solar cell constituent layers seriously obstruct the sensitivity of the technique, rendering it impossible to elucidate changes in the layer/interface structure at the sub-nanometer level. (c) 2008 Elsevier B.V. All rights reserved.
    Original languageEnglish
    JournalSolar Energy Materials & Solar Cells
    Issue number7
    Pages (from-to)793-798
    Publication statusPublished - 2008

    Bibliographical note

    This work was
    further supported by the Danish Strategic Research
    Council (DSF 2104-05-0052 and DSF-2104-07-0022).


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