Andreev Interference in the Surface Accumulation Layer of Half-Shell InAsSb/Al Hybrid Nanowires

Lukas Stampfer, Damon J. Carrad, Dags Olsteins, Christian E. N. Petersen, Sabbir A. Khan, Peter Krogstrup, Thomas S. Jespersen*

*Corresponding author for this work

Research output: Contribution to journalJournal articleResearchpeer-review

74 Downloads (Pure)

Fingerprint

Dive into the research topics of 'Andreev Interference in the Surface Accumulation Layer of Half-Shell InAsSb/Al Hybrid Nanowires'. Together they form a unique fingerprint.

Keyphrases

Engineering

Material Science