Analytical Deflection Profiles and Pull-In Voltage Calculations of Prestressed Electrostatic Actuated MEMS Structures

Andreas Spandet Havreland*, Erik Vilain Thomsen

*Corresponding author for this work

Research output: Contribution to journalJournal articlepeer-review

20 Downloads (Pure)

Fingerprint

Dive into the research topics of 'Analytical Deflection Profiles and Pull-In Voltage Calculations of Prestressed Electrostatic Actuated MEMS Structures'. Together they form a unique fingerprint.

Engineering & Materials Science