Analysis of the failure mechanism for a stable organic photovoltaic during 10 000 h of testing

Frederik C Krebs, Kion Norrman

    Research output: Contribution to journalJournal articleResearchpeer-review

    Abstract

    The degradation and failure mechanisms of a stable photovoltaic device comprising a bilayer heterojunction formed between poly(3-carboxythiophene-2,5-diyl-co-thiophene-2,5-diyl) (P3CT) and Buckminsterfullerene (C-60) sandwiched between indium tin oxide (ITO) and aluminium (Al) electrodes were elucidated by the time-of-flight secondary ion mass spectrometry (TOF-SIMS) analysis in conjunction with isotopic labelling using O-18(2) after a total testing time of 13 000 h. This experiment allowed us to understand the chemistry that takes place in three dimensions during degradation and failure of the device under accelerated testing conditions. The cell was subjected to continuous illumination with an incident light intensity of 1000 W m(-2) (AM1.5) at 72 +/- 2 degrees C under a vacuum of
    Original languageEnglish
    JournalProgress in Photovoltaics: Research and Applications
    Volume15
    Issue number8
    Pages (from-to)697-712
    ISSN1062-7995
    DOIs
    Publication statusPublished - 2007

    Bibliographical note

    This work was supported by the Danish Technical
    Research Council (STVF 2058-03-0016, STVF 26-
    04-0073) and the Danish Strategic Research Council
    (DSF 2104-04-0030, DSF 2104-05-0052).

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