Analysis of the effects of voltage pulses on P3HT:PCBM polymeric solar cells by means of TLP technique

Research output: Contribution to journalJournal article – Annual report year: 2018Researchpeer-review

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Analysis of the effects of voltage pulses on P3HT:PCBM polymeric solar cells by means of TLP technique. / Buonomo, M.; Torto, L.; Barbato, M.; Wrachien, N.; Rizzo, A.; Gevorgyan, S.A.; Krebs, F.C.; Cester, A.

In: Microelectronics Reliability, Vol. 88-90, 2018, p. 878-881.

Research output: Contribution to journalJournal article – Annual report year: 2018Researchpeer-review

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Buonomo, M. ; Torto, L. ; Barbato, M. ; Wrachien, N. ; Rizzo, A. ; Gevorgyan, S.A. ; Krebs, F.C. ; Cester, A. / Analysis of the effects of voltage pulses on P3HT:PCBM polymeric solar cells by means of TLP technique. In: Microelectronics Reliability. 2018 ; Vol. 88-90. pp. 878-881.

Bibtex

@article{80adb5889a144b2eaa18d232d597c180,
title = "Analysis of the effects of voltage pulses on P3HT:PCBM polymeric solar cells by means of TLP technique",
abstract = "We have studied the effects of an Electrostatic discharge stress on polymeric solar cells, employing P3HT:PCBM as active layer. All the analyzed devices featured a behavior strongly related to the evolution of the internal parasitic paths. We found that the degradation of the organic solar cells during the stress is related to the initial shunt condition. In addition, no breakdown occurred during the stress and only minor changes are visible from the photocurrent characteristics.",
keywords = "Organic solar cells, Electrostatic discharge, Transmission Line Pulse, Parasitic shunt",
author = "M. Buonomo and L. Torto and M. Barbato and N. Wrachien and A. Rizzo and S.A. Gevorgyan and F.C. Krebs and A. Cester",
year = "2018",
doi = "10.1016/j.microrel.2018.06.059",
language = "English",
volume = "88-90",
pages = "878--881",
journal = "Microelectronics Reliability",
issn = "0026-2714",
publisher = "Pergamon Press",

}

RIS

TY - JOUR

T1 - Analysis of the effects of voltage pulses on P3HT:PCBM polymeric solar cells by means of TLP technique

AU - Buonomo, M.

AU - Torto, L.

AU - Barbato, M.

AU - Wrachien, N.

AU - Rizzo, A.

AU - Gevorgyan, S.A.

AU - Krebs, F.C.

AU - Cester, A.

PY - 2018

Y1 - 2018

N2 - We have studied the effects of an Electrostatic discharge stress on polymeric solar cells, employing P3HT:PCBM as active layer. All the analyzed devices featured a behavior strongly related to the evolution of the internal parasitic paths. We found that the degradation of the organic solar cells during the stress is related to the initial shunt condition. In addition, no breakdown occurred during the stress and only minor changes are visible from the photocurrent characteristics.

AB - We have studied the effects of an Electrostatic discharge stress on polymeric solar cells, employing P3HT:PCBM as active layer. All the analyzed devices featured a behavior strongly related to the evolution of the internal parasitic paths. We found that the degradation of the organic solar cells during the stress is related to the initial shunt condition. In addition, no breakdown occurred during the stress and only minor changes are visible from the photocurrent characteristics.

KW - Organic solar cells

KW - Electrostatic discharge

KW - Transmission Line Pulse

KW - Parasitic shunt

U2 - 10.1016/j.microrel.2018.06.059

DO - 10.1016/j.microrel.2018.06.059

M3 - Journal article

VL - 88-90

SP - 878

EP - 881

JO - Microelectronics Reliability

JF - Microelectronics Reliability

SN - 0026-2714

ER -